Holon Co., Ltd. Development, manufacturing, and marketing of semiconductor inspection tools and overall maintenance services

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Research & Development

Holon measures the invisible small world with a nanometer scale
Holon measures the invisible small world with a nanometer scale

Joint development of a large-surface seamless roll mold

Holon has jointly with Asahi Kasei Corporation succeeded in the development of a large-surface area seamless roll mold for optical device fabrication. This achievement marks the first step in future developments geared at flexible electronic devices.
Details about this effort were publicly announced at the 37th International Conference on Micro and Nano Engineering (the international symposium that was held September 19-23, 2011 in Berlin).
A second public announcement followed at the 10th International Conference on Nanoimprint and Nanoprint Technology (NNT2011) held October 19-21, 2011 at Jeju, Korea.
The foundation of this success was provided by the electron beam technology of Holon.

Through this joint development, Holon succeeded in achieving a CD-SEM capable of direct observation of a roll mold, marking a global first. This CD-SEM was on display at the international symposium held at Jeju, Korea.
Seamless roll mold

In-house development of the world's first SEM for roll molds

Related to joint development work with Asahi Kasei Corporation, Holon succeeded in achieving the world's first SEM capable of direct observation of a roll mold.
The SEM enables observing and measuring the patterns formed by the roll mold.
SEM Imaging for Roller Mold ROLL-SEM

The world's first SEM for roll molds was honored with the Nano Fabrication Technology Award in Japan.

The world's first SEM for roll molds has been highly acclaimed and was honored with the nano tech Grand Award 2011 for Nano Fabrication Technology at the nano tech 2011 International Nanotechnology Exhibition & Conference that was held February 16-18, 2011 at Tokyo Big Sight.
Reasons for the award
The award appreciates the world's first development of an electron microscope enabling the observation and measurement of the micro patterns formed on the surface of a roll mold for high-speed roll print processing used in the production of parts for flexible electronics.